- Country: Canada
- Summary: Cryogenic Micromanipulator for Focused Ion Beam Scanning Electron Microscopy
- CAT Ref No: 70484956
- Deadline: 19 Sep 2022
- Financier: Self Financed
- Purchaser Ownership: Government
- Tender Value: Refer Document
- Notice Type: Tender
- Document Ref. No.: 0000230494
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- Description:
- Cryogenic Micromanipulator for Focused Ion Beam Scanning Electron Microscopy
Solicitation Type : ACAN - Advance Contract Award Notice (Formal)
Solicitation Number : JC 05-21-810
Location : Canada, Ontario, Hamilton-Niagara Peninsula
Delivery Point : McMaster University
Description : Background and Purpose McMaster University and the Canadian Centre for Electron Microscopy (CCEM), have a requirement for one (1) cryogenic micromanipulator for focused ion beam scanning electron microscopy (FIB-SEM). The CCEM is the national facility for electron microscopy and is committed to provide its user base with accessible specialized electron microscopy services, one of which is access to workflows for sample preparation and analysis of materials under cryogenic conditions. Working with temperature and beam-sensitive materials which are not stable at room temperature requires a suite of dedicated equipment which can maintain cryogenic conditions at every stage. Sample preparation for advanced microanalysis methods such as transmission electron microscopy (TEM) and atom probe tomography (APT) is often conducted via FIB-SEM for the combination of sample quality and site-specificity it offers. FIB-SEM sample preparation using so-called “ex situ liftout” methods requires use of a micromanipulator in order to extract the region of interest from the bulk material. Such micromanipulators must be stable and capable of precise movements at sub-micron length scales. For s... - Documents:
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CLICK HERE TO LOGINCryogenic Micromanipulator for Focused Ion Beam Scanning Electron Microscopy - Canada Tender
The MCMASTER UNIVERSITY, a Government sector organization in Canada, has announced a new tender for Cryogenic Micromanipulator for Focused Ion Beam Scanning Electron Microscopy. This tender is published on CanadaTenders under CAT Ref No: 70484956 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2022-09-19.
The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.
